Engineering students to study effect of radiation on memory devi - wave3.com-Louisville News, Weather & Sports

Engineering students to study effect of radiation on memory devices

Professor Bruce Alphenaar (Source: WAVE 3 News) Professor Bruce Alphenaar (Source: WAVE 3 News)

LOUISVILLE, KY (WAVE) - Groundbreaking research will soon take place on the University of Louisville's campus.

UofL's J.B. Speed School of Engineering will begin a study on the effect of radiation on computer memory devices.

The fear of radiation damage could prove to be a huge problem in the event of a dirty bomb or nuclear power plant attack.

Professor Bruce Alphenaar said, "We're excited not only for understanding the affect of radiation on these devices, but also for the likelihood that we can develop a memory device that will withstand radiation in these types of situations or scenarios. Like outer space or in a nuclear accident or if there is some terrorist attack."

Students at UofL and Vanderbilt will collaborate in the project which is being funded by a $1.5 million grant from the United States Department of Defense.

Copyright 2015 WAVE 3 News. All rights reserved.

Powered by Frankly